A new method for repeated localization and matching of tunnel lining defects
Xinwen Gao a b, Yumeng Yang c b, Zheng Xu c b, Zhiyuan Gan a b
a School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, 201900, China
b SHU-SUCG Research Center of Building Industrialization, Shanghai University, Shanghai, 201800, China
c SILC Business School, Shanghai University, Jiading District, Shanghai, 201899, China
https://www.sciencedirect.com/science/article/abs/pii/S0952197624000137
cover tunnel photo by: Matt Brown from London, England / CC BY
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